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Parallel Transmission Electron and Atomic Force Microscopy: Direct andRepetitive Correlation of TEM and AFM images by a Novel Sample Holder

机译：并联透射电子和原子力显微镜：通过新型样品架的TEM和AFM图像的直接和释放相关性

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《Microscopy Society of America annual meeting 》|2002年||共2页
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Alvin C. Lin; M. Cynthia Goh;
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中图分类观察、分析晶体结构的实验方法 ;
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专利

1. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images. [J] . Lin AC, Goh MC Journal of Microscopy . 2002 ,第Pta2期

机译：一种新颖的样品架，允许在透射电子显微镜标本网格上进行原子力显微镜检查：AFM和TEM图像之间的重复直接相关。
2. A novel sample holder allowing atomic force microscopy on transmission electron microscopy specimen grids: repetitive, direct correlation between AFM and TEM images [J] . Lin AC., Goh MC. Journal of Microscopy . 2002 ,第Pta2期

机译：一种新颖的样品架，允许在透射电子显微镜标本网格上进行原子力显微镜检查：AFM和TEM图像之间的重复直接相关
3. Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles [J] . Sobchenko I, Pesicka J, Baither D, Philosophical magazine: structure and properties of condensed matter . 2007 ,第16a17期

机译：纳米级板状第二相颗粒的原子力显微镜（AFM），透射电子显微镜（TEM）和扫描电子显微镜（SEM）
4. Parallel Transmission Electron and Atomic Force Microscopy: Direct andRepetitive Correlation of TEM and AFM images by a Novel Sample Holder [C] . Alvin C. Lin, M. Cynthia Goh Microscopy Society of America annual meeting . 2002

机译：并联透射电子和原子力显微镜：通过新型样品架的TEM和AFM图像的直接和释放相关性
5. Characterization of silicon surfaces by ellipsometry, atomic force microscopy (AFM), and auger electron spectroscopy (AES). [D] . Fang, Sung-Jen. 1996

机译：通过椭偏仪，原子力显微镜（AFM）和俄歇电子能谱（AES）表征硅表面。
6. Measuring the Autocorrelation Function of Nanoscale Three-Dimensional Density Distribution in Individual Cells Using Scanning Transmission Electron Microscopy Atomic Force Microscopy and a New Deconvolution Algorithm [O] . Yue Li, Di Zhang, Ilker Capoglu, -1

机译：使用扫描透射电子显微镜原子力显微镜和新的反卷积算法测量单个细胞中纳米级三维密度分布的自相关函数
7. Imaging silicon by atomic force microscopy with crystallographically oriented tips (so in der ZS angegeben) Vom Verfasser so:\ud Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy / Proceedings of NC-AFM 2000 [O] . Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut, 2001

机译：通过原子力显微镜对硅进行成像，并具有晶体学取向的尖端（所以在der ZS angegeben中）Vom Verfasser如此：\ ud 通过原子力显微镜用晶体学取向的尖端对硅进行成像/ NC-AFM 2000的论文集
8. Direct imaging of the atomic structure and chemistry of defects and interfaces by Z-contrast STEM (scanning transmission electron microscopy). [R] . Pennycook, S. J., Chisholm, M. F., Jesson, D. E., 1990

机译：通过Z对比sTEm（扫描透射电子显微镜）直接成像原子结构和缺陷和界面的化学。

Parallel Transmission Electron and Atomic Force Microscopy: Direct andRepetitive Correlation of TEM and AFM images by a Novel Sample Holder

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