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METHOD FOR PREPARING INDEPENDENT BIGRID FINFET ON BULK SILICON

机译:在块状硅上制备独立的二进制finFET的方法

摘要

Disclosed is a method for preparing an independent bigrid FinFET on bulk silicon, comprising: forming a source and a drain and a thin strip-shaped graphic structure connecting the source and the drain; forming an oxide isolating layer; forming a gate structure and a source and drain structure; and forming metal contacts and metal connections. With the method, the independent bigrid FinFET can be easily formed on bulk silicon, the entire technological process is completely compatible with the conventional silicon-based super-large-scale integrated circuit manufacturing technology and has the characteristics of simplicity, convenience and short period, and the cost of silicon wafers is greatly economized. Moreover, because the independent bigrid FinFET prepared by the method is adopted, the short-channel effect can be well inhibited, and the power consumption of the device is further reduced by using the peculiar multi-threshold characteristic of the independent bigrid device.
机译:公开了一种在块状硅上制备独立的大尺寸FinFET的方法,包括:形成源极和漏极以及连接所述源极和漏极的带状图形结构;形成氧化物隔离层;形成栅极结构以及源极和漏极结构;并形成金属触点和金属连接。利用该方法,可以容易地在块状硅上形成独立的大面积FinFET,整个工艺过程与常规的硅基超大规模集成电路制造技术完全兼容,具有简单,方便,周期短的特点。大大节省了硅晶片的成本。而且,由于采用了通过该方法制备的独立的Bigrid FinFET,因此可以通过利用独立的bigrid器件的独特的多阈值特性来很好地抑制短沟道效应,并进一步降低了器件的功耗。

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