首页> 外国专利> SPACER FILL STRUCTURE, METHOD AND DESIGN STRUCTURE FOR REDUCING DEVICE VARIATION

SPACER FILL STRUCTURE, METHOD AND DESIGN STRUCTURE FOR REDUCING DEVICE VARIATION

机译:减少设备变化的间隔填充结构,方法和设计结构

摘要

A design structure is provided for spacer fill structures and, more particularly, spacer fill structures, a method of manufacturing and a design structure for reducing device variation is provided. The structure includes a plurality of dummy fill shapes in different areas of a device which are configured such that gate perimeter to gate area ratio will result in a total perimeter density being uniform across a chip.
机译:提供了用于间隔物填充结构的设计结构,并且更具体地,提供了用于间隔物填充结构的制造方法和用于减少器件变化的设计结构。该结构包括在器件的不同区域中的多个虚拟填充形状,其被配置为使得栅极周长与栅极面积之比将导致整个周长密度在整个芯片上是均匀的。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号