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Processing detector array signals using stacked readout integrated circuits

机译:使用堆叠式读出集成电路处理检测器阵列信号

摘要

According to certain embodiments, an apparatus comprises a first readout integrated circuit (ROIC) (20), a second ROIC (22), and a dual band detector array (24). The first ROIC comprises first unit cells (40). The second ROIC is disposed outwardly from the first ROIC and comprises a second unit cells (42). Electrically conductive vias (50) are disposed through the second ROIC and at least into the first ROIC. The detector array (24) is disposed outwardly from the second ROIC (22). The detector array is configured to detect high dynamic range infrared light and comprises detector pixels (38). Each detector pixel is configured to generate a current in response to detecting light and send the current to a via. A via is configured to send the signal to a second unit cell and a first unit cell.
机译:根据某些实施例,一种设备包括第一读出集成电路(ROIC)(20),第二ROIC(22)和双频带检测器阵列(24)。第一ROIC包括第一单位单元(40)。第二ROIC从第一ROIC向外布置,并且包括第二单元(42)。导电通孔(50)穿过第二ROIC并且至少进入第一ROIC。检测器阵列(24)从第二ROIC(22)向外布置。检测器阵列被配置为检测高动态范围的红外光,并且包括检测器像素(38)。每个检测器像素被配置为响应于检测到光而产生电流并将该电流发送至通孔。通孔被配置为将信号发送到第二单位单元和第一单位单元。

著录项

  • 公开/公告号EP2456193A3

    专利类型

  • 公开/公告日2014-08-20

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号EP20110190023

  • 发明设计人 GRAHAM ROGER W;

    申请日2011-11-21

  • 分类号H04N5/33;H04N5/355;G01J3/28;G01J3/36;H01L27/146;

  • 国家 EP

  • 入库时间 2022-08-21 15:49:35

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