A method to evaluate the presence of a source of x-ray beam inhomogeneity during x-ray exposure.

摘要

A method to evaluate the presence of a source of x-ray beam in-homogeneity during x-ray exposure.;A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x-ray detector and deciding upon the presence of a source of x-ray beam in-homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.