A METHOD TO EVALUATE THE PRESENCE OF A SOURCE OF X-RAY BEAM INHOMOGENEITY DURING X-RAY EXPOSURE

摘要

A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x-ray detector and deciding upon the presence of source of x-ray beam in-homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.