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IN-SITU CONTACT POTENTIAL MEASUREMENT IN HARD DISK DRIVES
IN-SITU CONTACT POTENTIAL MEASUREMENT IN HARD DISK DRIVES
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机译:硬盘驱动器中的原位接触电势测量
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摘要
Provided are approaches for a hard-disk drive (HDD) and a method for measuring contact potential between a head and disk interfaces within the hard-disk drive. In one embodiment, voltage bias is applied to a head slider at discrete increments, and touchdown power is determined at each increment. The voltage, at which the TDP is maximized, is equal to inverse polarity of inherent contact potential between the head slider and a disk, and this value may be used to apply voltage that neutralizes the contact potential.;COPYRIGHT KIPO 2014
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