首页> 外国专利> IN-SITU CONTACT POTENTIAL MEASUREMENT IN HARD DISK DRIVES

IN-SITU CONTACT POTENTIAL MEASUREMENT IN HARD DISK DRIVES

机译:硬盘驱动器中的原位接触电势测量

摘要

Provided are approaches for a hard-disk drive (HDD) and a method for measuring contact potential between a head and disk interfaces within the hard-disk drive. In one embodiment, voltage bias is applied to a head slider at discrete increments, and touchdown power is determined at each increment. The voltage, at which the TDP is maximized, is equal to inverse polarity of inherent contact potential between the head slider and a disk, and this value may be used to apply voltage that neutralizes the contact potential.;COPYRIGHT KIPO 2014
机译:提供了一种用于硬盘驱动器(HDD)的方法以及一种用于测量硬盘驱动器中的磁头和磁盘接口之间的接触电势的方法。在一个实施例中,以离散的增量将电压偏置施加到磁头滑动器,并以每个增量确定着陆功率。 TDP最大化时的电压等于磁头滑块和磁盘之间固有接触电势的反极性,并且该值可用于施加中和接触电势的电压。; COPYRIGHT KIPO 2014

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号