首页> 外文会议>ASME conference on information storage and processing systems >IN-SITU CONTACT POTENTIAL MEASUREMENT IN HARD DISK DRIVES USING HEAD DISK INTERFACE VOLTAGE CONTROL
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IN-SITU CONTACT POTENTIAL MEASUREMENT IN HARD DISK DRIVES USING HEAD DISK INTERFACE VOLTAGE CONTROL

机译:使用磁头磁盘界面电压控制的硬磁盘驱动器中的原位接触电势测量

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There is an inherent contact potential difference between the head and the disk surfaces in hard disk drives (HDD's). Current HDD's use thermal fly-height control (TFC) during read/write operations. In this study, we show a method to determine the contact potential for the head disk interface (HDI) using TFC technology. We utilize TFC to measure the flying height of the slider via touchdown power by applying a DC voltage bias to either the head or the disk or both. The DC voltage condition where the TFC clearance is maximized corresponds to the balancing of the HDI contact potential. In other words, the opposite polarity of that DC voltage bias condition is the HDI contact potential. Additionally, we show that the contact potential of HDI can be determined by either applying the DC voltage bias to the head or to the disk.
机译:硬盘驱动器(HDD)的磁头和磁盘表面之间存在固有的接触电势差。当前的硬盘驱动器在读/写操作期间使用热飞高控制(TFC)。在这项研究中,我们展示了一种使用TFC技术确定磁头磁盘接口(HDI)接触电位的方法。我们利用TFC通过在磁头或磁盘或两者上施加直流电压偏置来通过接地功率来测量滑块的浮动高度。 TFC间隙最大的直流电压条件对应于HDI接触电势的平衡。换句话说,该直流电压偏置条件的相反极性是HDI接触电势。此外,我们表明,可以通过将DC偏压施加到磁头或磁盘来确定HDI的接触电势。

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