首页> 外国专利> Structure For Crystallization, Method of Crystallization, Method of Forming Active layer of Semiconductor Amorphous silicon layer, And Manufacturing Method of Thin Film Transistor Using the Same

Structure For Crystallization, Method of Crystallization, Method of Forming Active layer of Semiconductor Amorphous silicon layer, And Manufacturing Method of Thin Film Transistor Using the Same

机译:结晶结构,结晶方法,形成半导体非晶硅层的有源层的方法以及使用该结构的薄膜晶体管的制造方法

摘要

invention Localization crystal structure , crystallization method , and a semiconductor active layer formed using this method and a method for forming a thin film transistor relates , determined for Localization of the support structure is plate-like and plate-like on the support having a lower part provided with a projection doedoe having a flat lower surface a plurality of spaced apart at a predetermined distance from each other , is applied to the lower surface temperature is heated by accessing the object when the temperature of the bottom surface is higher than the temperature of the support .
机译:定位晶体结构,结晶化方法,以及用该方法形成的半导体有源层和薄膜晶体管的形成方法,确定了支撑结构的定位是板状的,并且在下部具有支撑的板状当底面的温度高于底面的温度时,通过接触物体来加热底面温度;底面的平坦的底面彼此隔开预定的距离。支持。

著录项

  • 公开/公告号KR101336455B1

    专利类型

  • 公开/公告日2013-12-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20070052852

  • 发明设计人 김현재;정태훈;이충희;

    申请日2007-05-30

  • 分类号H01L21/324;H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-21 15:44:08

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