due to the thermal expansion of the probe card and the card holder to suppress the variation of the position of the probe tip caused a probe card fixture , probe inspection apparatus , inspection method provides a probe and a probe card to be . The probe card probe card retainer for securing (10 ) to the prober , the connection ring for fixing to the housing of the prober 30 and , fitting the outer peripheral portion of the connection ring 30 and between the probe card 10 and a card holder 20 for holding , and a PCLS (50) for fixing the central portion and the connection ring 30 of the probe card (10). ;
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