首页> 外国专利> METHOD OF MANUFACTURING CUBIC BORON NITRIDE THIN FILM HAVING REDUCED RESIDUAL COMPRESSION STRESS AND CUBIC BORON NITRIDE THIN FILM MANUFACTURED THEREBY

METHOD OF MANUFACTURING CUBIC BORON NITRIDE THIN FILM HAVING REDUCED RESIDUAL COMPRESSION STRESS AND CUBIC BORON NITRIDE THIN FILM MANUFACTURED THEREBY

机译:具有减小的残余压缩应力的制造立方氮化硼薄膜的方法和由此制造的立方氮化硼薄膜

摘要

A method of manufacturing a cubic boron nitride (c-BN) thin film may include applying a pulse type bias voltage; and forming the c-BN thin film by making an ion collide with the substrate using the pulse type bias voltage. In this case, a ratio of an on/off duration time of the pulse type bias voltage may be adjusted to control the residual compression stress of the c-BN thin film. The residual compression stress applied to the thin film is minimized using a pulse type voltage as a negative bias voltage applied to the substrate, and the c-BN thin film is deposited in an area with low ion energy by increasing a ratio of ion/neutron by adjusting the ratio of the on/off duration time of the pulse type voltage.;COPYRIGHT KIPO 2014
机译:一种制造立方氮化硼(c-BN)薄膜的方法可以包括施加脉冲型偏置电压;或将脉冲型偏置电压施加到衬底。通过使用脉冲型偏压使离子与基板碰撞而形成c-BN薄膜。在这种情况下,可以调节脉冲型偏置电压的开/关持续时间的比率,以控制c-BN薄膜的残余压缩应力。使用脉冲型电压作为施加到基板上的负偏压将施加到薄膜上的残余压缩应力降至最低,并且通过增加离子/中子的比率,将c-BN薄膜沉积在离子能量较低的区域中通过调整脉冲型电压的开/关持续时间的比例。; COPYRIGHT KIPO 2014

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