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DEVICE AND METHOD FOR DETERMINING THE LOCATION OF PARAMETERS OF QUALITY AND / OR SYSTEMS properties of inorganic binders
DEVICE AND METHOD FOR DETERMINING THE LOCATION OF PARAMETERS OF QUALITY AND / OR SYSTEMS properties of inorganic binders
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机译:测定无机粘结剂的质量和/或系统性能参数的位置的装置和方法
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摘要
1. An apparatus for determining in situ the quality parameters and / or properties of inorganic binders systems, especially mixtures solidified, the system of binders is located in the receiving element (18) which has at least one wall (1, 2) a probe (15.1, 15.2) and has a contact material for compensating possible clearances between the system of binders and the probe, characterized in that between the system of binders and a probe (15.1, 15.2) is a chamber (10.1, 10.2) for the contact material adapts to zhatiyu, shrinkage or expansion veschestv.2 binder system. The apparatus according to claim 1, characterized in that the binder system is separated from the contact material membrane (12.1, 12.2) .3. The apparatus according to claim 2, characterized in that the membrane (12.1, 12.2) is arranged between the plate (11.1, 11.2) and the wall (1, 2) and, if necessary inserted in said wall (1, 2) .4. Apparatus according to claim 3, characterized in that the plate (11.1, 11.2) connected to said wall (1, 2), with udaleniya.5. The apparatus according to claim 1, characterized in that the chamber (10.1, 10.2) disposed in said wall (1, 2) .6. The apparatus according to claim 1, characterized in that the chamber (10.1, 10.2) includes a funnel-shaped recess (9.1, 9.2) .7. The apparatus according to claim 1, characterized in that the chamber (10.1, 10.2) or the funnel-shaped recess (9.1, 9.2) are arranged to close the valve (8.1, 8.2) .8. The apparatus according to claim 1, characterized in that the chamber (10.1, 10.2) is provided in the wall (1, 2) a probe (15.1, 15.2) .9. The apparatus according to claim 1, characterized in that the receiving element (18) is made U-shaped and is disposed between two walls (1, 2) made generally identical and respectively provided with a probe (15.1, 15.2) .10. The apparatus according to claim 9, distinguished
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