Device for determining thickness of zinc layer on iron layer of test object and iron content in zinc layer on iron layer of test object, has X-ray source for determining X-ray radiation on test object with zinc layer on iron layer

摘要

The determining device (1) has an X-ray source (2) for determining X-ray radiation (14) on a test object (18) with a zinc layer (18a) on an iron layer (18b). A fluorescence detecting device (4,4') determines a fluorescence radiation on the basis of iron in the test object. A Compton detection device (6,6'), which determines Compton control on the basis of iron in the test object. Another fluorescence detecting device determines another fluorescence radiation on the basis of iron in the test object. An independent claim is included for a method for determining thickness of a zinc layer on iron layer of test object and iron content in the zinc layer on iron layer of test object.