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Detection device and system for measuring the thickness of a zinc layer on steel and measuring the iron content of a zinc layer

机译:用于测量钢上锌层厚度并测量锌层中铁含量的检测装置和系统

摘要

Determining device (50) which is adapted to measure the thickness of a zinc layer (18a) on an iron layer (18b) of a test object (18) and the iron portion (18c) in the zinc layer (18a) on the iron layer (18b) of the test object (18 ), comprising: - an X-ray source (2) emitting X-radiation (14) on the test object (18) with the zinc layer (18a) on the iron layer (18b); - A first fluorescence detection means (4, 4 ') which determines a first fluorescence radiation due to iron (18b) in the test object (18), which is scattered at a first angular segment of the test object (18); - Compton detection means (6, 6 '), which detects a Compton scattering due to iron (18b) in the test object (18), which is scattered under a first angle segment of the test object (18); - Second fluorescence detection means (52, 52 ') which detects a second fluorescence radiation due to iron (18b, 18c) in the test object (18), which is scattered under a second angle segment of the test object (18); - Third fluorescence detection means (52, 52 ') which detects a third fluorescence radiation due to zinc (18a) in the test object (18), which is scattered under a second angle segment of the test object (18); and - a first evaluation device (24a) which is designed to determine the thickness of the zinc layer (18a) on the iron layer (18b) of the test object (18) from the first fluorescence radiation and the Compton scattering; and - a second evaluation device (24b) which is designed to determine the iron portion (18c) in the zinc layer (18a) from the first fluorescence radiation, the second fluorescence radiation and the third fluorescence radiation, characterized in that the Compton detection device (6 , 6 ') has a filter arrangement which is designed such that the radiation emitted by the test object (18) due to the Compton scattering passes through a nickel layer (10) and an iron layer (8) after being scattered by a test object (18) and before it is detected by a sensor of the Compton detection device (6, 6 ').
机译:确定装置(50),其适于测量测试对象(18)的铁层(18b)上的锌层(18a)和铁上的锌层(18a)中的铁部分(18c)的厚度。测试对象(18)的层(18b),包括:-X射线源(2)在测试对象(18)上发射X射线(14),而锌层(18a)在铁层(18b)上); -第一荧光检测装置(4、4'),其确定了由于铁(18b)在测试物体(18)中的第一荧光辐射,所述第一荧光辐射散布在测试物体(18)的第一角段处; -康普顿检测装置(6、6'),其检测由于铁(18b)在测试物体(18)中的康普顿散射,所述康普顿散射在测试物体(18)的第一角度段下散射; -第二荧光检测装置(52、52'),该第二荧光检测装置(52,52')检测由铁(18b,18c)引起的第二荧光辐射,该第二荧光辐射散布在测试对象(18)的第二角度段内; -第三荧光检测装置(52、52'),该第三荧光检测装置(52,52')检测在被检体(18)的第二角度范围内散射的,被检体(18)中的锌(18a)引起的第三荧光辐射。 -第一评估装置(24a),其被设计用于根据第一荧光辐射和康普顿散射来确定测试对象(18)的铁层(18b)上的锌层(18a)的厚度; -第二评估装置(24b),用于根据第一荧光辐射,第二荧光辐射和第三荧光辐射确定锌层(18a)中的铁部分(18c),其特征在于,所述康普顿检测装置(6、6')具有过滤器装置,该过滤器装置被设计成使得由康普顿散射引起的由测试对象(18)发出的辐射在被镍(10)和铁(8)散射之后通过镍层(10)和铁层(8)。测试对象(18),并且在被康普顿检测设备(6、6')的传感器检测到之前。

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