首页> 外国专利> Arrangement for determining anti-scatter reduced primary beam projected image in X-ray imaging of object for X-ray device, has X-ray source for generating X-radiation and X-ray detector

Arrangement for determining anti-scatter reduced primary beam projected image in X-ray imaging of object for X-ray device, has X-ray source for generating X-radiation and X-ray detector

机译:用于在用于X射线设备的对象的X射线成像中确定抗散射减小的主光束投影图像的装置,具有用于产生X射线的X射线源和X射线检测器

摘要

The arrangement has an X-ray source (5) for generating an X-radiation (8) and an X-ray detector (6), where a first panel (1) is arranged between an object (7) and the X-ray source. A second panel (3) is arranged between the object and the X-ray detector. A primary radiation (9) passing to the first panel is blocked by the second panel before reaching to the X-ray detector. An independent claim is included for a method for determining an anti-scatter reduced primary beam projected image in an X-ray imaging of an object.
机译:该装置具有用于产生X射线(8)的X射线源(5)和X射线检测器(6),其中第一面板(1)布置在物体(7)和X射线之间。资源。在物体和X射线探测器之间布置第二面板(3)。到达第一面板的主要辐射(9)在到达X射线检测器之前被第二面板阻挡。包括关于确定对象的X射线成像中的防散射减小的主光束投影图像的方法的独立权利要求。

著录项

  • 公开/公告号DE102012220245A1

    专利类型

  • 公开/公告日2014-05-08

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE201210220245

  • 发明设计人 DENNERLEIN FRANK;

    申请日2012-11-07

  • 分类号G01N23/06;A61B6/03;A61B6/06;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:35

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