Test pin device for use in modular test system for testing contact partner, has inner housing with inner chamber for incorporation of light conductor, where clamping element is arranged against inner housing as additional element

摘要

The test pin device (10) has a contact section for contacting a contact partner with a light conductor (50) for test purpose, and is provided on a probe end (14) of an inner housing. The inner housing has an inner chamber, particularly a bore, for incorporation of the light conductor, where a clamping element is arranged against the inner housing as additional element, particularly a clamping bush. The clamping bush has a cylindrical receiving space for guiding the reception of the light conductor, where a fixing device is adjusted on moving sub-area of the clamping element by force exertion. Independent claims are included for the following: (1) a modular test system for testing a contact partner; and (2) an assortment for the formation of a test system.