首页> 外国专利> Method for measuring refractive index of medium to be measured over optical window, involves guiding light incoming from light source on structure that has wavelength of light, where structure is formed from upper surface of optical window

Method for measuring refractive index of medium to be measured over optical window, involves guiding light incoming from light source on structure that has wavelength of light, where structure is formed from upper surface of optical window

机译:在光学窗口上测量待测介质的折射率的方法,包括将来自光源的光引导到具有光波长的结构上,其中结构是从光学窗口的上表面形成的

摘要

The method involves guiding the light incoming from a light source (8) on a structure that has a wavelength of light, where the structure is formed from an upper surface of an optical window (1). The light is guided in the desired angles to the boundary surface between the optical window and the medium to be measured. The light reflected from the boundary surface between the optical window and the medium to be measured is guided on another structure, with which the light is guided for analysis. An independent claim is included for a refractometer for measuring a refractive index on a liquid.
机译:该方法包括在具有光波长的结构上引导从光源(8)入射的光,其中该结构由光学窗口(1)的上表面形成。将光以所需的角度引导到光学窗口和要测量的介质之间的边界表面。从光学窗口和要测量的介质之间的边界表面反射的光在另一结构上引导,通过该结构引导光进行分析。包括用于测量液体的折射率的折光仪的独立权利要求。

著录项

  • 公开/公告号DE102014201079A1

    专利类型

  • 公开/公告日2014-07-24

    原文格式PDF

  • 申请/专利权人 JANESKO OY;

    申请/专利号DE201410201079

  • 发明设计人 VOIPIO VILLE;

    申请日2014-01-22

  • 分类号G01N21/43;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:06

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