Tester for transmission of signals at high frequency and the card probe using that - ci.

摘要

A probe for transmitting high-frequency signals comprising a metal pin (51), and a metal (520) arranged so as to be spaced apart on and electrically insulated with respect to the metal pin (51) and electrically connected to ground potential, so as to maintain the characteristic impedance of the probe at the moment of the transmission of a high frequency signal. The maximum diameter of the probe is substantially less than or equal to twice the diameter of the metal pin (51). Under these conditions, a large quantity of probes can be installed on a card probe in order to test a large number of electronic devices, such as an electronic test at the level of a wafer of semiconductor - driver can be made of an effective manner and rapid.