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FLATNESS MEASURING DEVICE OF BGA AND FLATNESS MEASUREMENT METHOD OF BGA

机译:BGA的平整度测量装置及BGA的平整度测量方法

摘要

PROBLEM TO BE SOLVED: To provide a flatness measuring device of BGA for measuring deformation of a package during heating without mechanical removal of a solder ball.;SOLUTION: Measurement data 60a-1 and measurement data 60b-1 are piled together, to thereby generate ball existence surface three-dimensional shape data 16-1. Solder ball data parts 58-1 and 58-2 are determined by a ball absence surface three-dimensional shape data generation part, and the solder ball data parts 58-1 and 58-2 are removed by program processing, to thereby generate ball absence surface three-dimensional shape data 21-1.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种BGA的平坦度测量装置,该平坦度测量装置用于测量加热期间的封装变形而无需机械移除焊球。解决方案:将测量数据60a-1和测量数据60b-1堆叠在一起,从而产生球存在面三维形状数据16-1。焊球数据部分58-1和58-2由无焊球表面三维形状数据产生部分确定,并且焊球数据部分58-1和58-2通过程序处理被去除,从而产生无焊球表面三维形状数据21-1 .;版权:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015148481A

    专利类型

  • 公开/公告日2015-08-20

    原文格式PDF

  • 申请/专利权人 CORES:KK;

    申请/专利号JP20140020545

  • 发明设计人 HANEDA MAKOTO;

    申请日2014-02-05

  • 分类号G01B11/25;H01L23/12;

  • 国家 JP

  • 入库时间 2022-08-21 15:35:37

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