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ALIGNMENT DEVICE, MICROSCOPIC SYSTEM, ALIGNMENT METHOD, AND ALIGNMENT PROGRAM

机译:校准设备,显微系统,校准方法和校准程序

摘要

PROBLEM TO BE SOLVED: To provide an alignment device and the like that can acquire detailed inclination information between a placing surface of a subject and an imaging device without providing a mechanism dedicated to alignment.;SOLUTION: An alignment device includes an image acquisition unit 21 that acquires an image obtained by photographing an area of a subject entering the field of view of an observation optical system provided opposite to the subject, a focus area detection unit 231 that detects a focus area from the image, and an inclination information calculation unit 232 that calculates inclination information between the observation optical system and the subject on the basis of information on the focus area detected by the focus area detection unit 231.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种对准装置等,其可以在不提供对准专用机构的情况下获取被检体的放置表面与成像装置之间的详细的倾斜信息。解决方案:对准装置包括图像获取单元21图像获取部,该图像获取部通过拍摄被摄体进入与被摄体相对设置的观察光学系统的视场的区域而获得的图像;聚焦区域检测单元231,其从图像中检测聚焦区域;以及倾斜信息计算单元232 ;其基于焦点区域检测单元231检测到的关于焦点区域的信息来计算观察光学系统与被摄体之间的倾斜度信息。;版权:(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP2015102694A

    专利类型

  • 公开/公告日2015-06-04

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20130243356

  • 发明设计人 ABE YOKO;

    申请日2013-11-25

  • 分类号G02B7/28;G02B21/00;

  • 国家 JP

  • 入库时间 2022-08-21 15:33:25

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