首页>
外国专利>
LIGHT RAY PROPERTY MEASUREMENT DEVICE FOR LIGHT RAY DIRECTIVITY CONTROL SECTION, AND LIGHT RAY PROPERTY MEASUREMENT METHOD FOR LIGHT RAY DIRECTIVITY CONTROL SECTION
LIGHT RAY PROPERTY MEASUREMENT DEVICE FOR LIGHT RAY DIRECTIVITY CONTROL SECTION, AND LIGHT RAY PROPERTY MEASUREMENT METHOD FOR LIGHT RAY DIRECTIVITY CONTROL SECTION
展开▼
机译:光线方向性控制部分的光线特性测量装置以及光线方向性控制部分的光线特性测量方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To evaluate an effectiveness of a light ray directivity control section of a light-emitting device without actually fabricating the light-emitting device.SOLUTION: A light ray property measurement device 1 comprises: an evaluation sample 10 including a transparent substrate 13 composed of the same material as a transparent dielectric layer 170 of a light-emitting device 110A, and light ray directivity control sections 11, 12 arranged on the transparent substrate 13 in an annular manner and having the same configuration as light ray directivity control sections 111, 112 of the light-emitting device 110A; a light source 20 irradiating an incidence surface 13a of the transparent substrate 13 with light; and a light detector 30 detecting a light ray emitted from the light ray directivity control sections 11, 12 of the evaluation sample 10 to measure the property. A distance D2 from bottom surfaces of the light ray directivity control sections 11, 12 of the evaluation sample 10 to the incidence surface 13a is equal to a distance D1 from bottom surfaces of the light ray directivity control sections 111, 112 of the light-emitting device 110A to a top face of a light-emitting section 120. The incidence surface 13a of the transparent substrate 13 included in the evaluation sample 10 serves as a diffusion surface.
展开▼