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MANUFACTURING METHOD OF MESA TYPE SEMICONDUCTOR DEVICE, AND MESA TYPE SEMICONDUCTOR DEVICE

机译:Mesa型半导体装置的制造方法以及mesa型半导体装置

摘要

PROBLEM TO BE SOLVED: To provide a manufacturing method of a mesa type semiconductor device which prevents characteristics from being deteriorated by generating a deep level over a whole region of a semiconductor substrate.;SOLUTION: The manufacturing method of the mesa type semiconductor device includes: a semiconductor substrate preparation step of preparing a semiconductor substrate 110 including an n++ type silicon substrate 112, an n- type epitaxial layer 114 and a p+ type anode layer 116; a groove forming step of forming a groove 126 for mesa region formation having depth exceeding at least pn junction from a surface of the p+ type anode layer 116; a heavy metal containing paste layer forming step of forming a heavy metal containing paste layer 118 on an inner face of the groove 126; and a heavy metal diffusion step of forming a heavy metal diffusion region 122 by diffusing a heavy metal into the semiconductor substrate 110 by heating the inside of the semiconductor substrate 110 by irradiating the inside of the semiconductor substrate 110 with laser light L1 from the surface of the groove 126 at a predetermined inclination angle and over a full circumference of the groove 126.;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种台面型半导体器件的制造方法,其通过在半导体衬底的整个区域上产生深的深度来防止特性劣化。解决方案:台面型半导体器件的制造方法包括:半导体衬底制备步骤,制备包括n ++ 型硅衬底112,n -型外延层114和ap + 型阳极层116;沟槽形成步骤,形成用于从p + 型阳极层116的表面起至少超过pn结的深度的台面区域形成用沟槽126;重金属糊剂层形成步骤,在槽126的内表面上形成重金属糊剂层118。重金属扩散步骤,通过从半导体基板110的内部照射激光L1对半导体基板110的内部进行加热,从而对半导体基板110的内部进行加热,从而将重金属扩散到半导体基板110中,从而形成重金属扩散区域122。凹槽126以预定的倾斜角度并在凹槽126的整个圆周上。;版权所有:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2015179712A

    专利类型

  • 公开/公告日2015-10-08

    原文格式PDF

  • 申请/专利权人 SHINDENGEN ELECTRIC MFG CO LTD;

    申请/专利号JP20140055847

  • 发明设计人 NAGASE SHINICHI;WATABE MASAYA;

    申请日2014-03-19

  • 分类号H01L29/861;H01L29/868;H01L21/329;H01L29/06;H01L29/74;H01L21/331;H01L29/73;H01L29/739;H01L29/78;H01L21/336;H01L21/322;H01L21/22;H01L21/225;

  • 国家 JP

  • 入库时间 2022-08-21 15:32:51

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