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irradiation defect inspection method, irradiation failure of the inspection device, and an image forming apparatus

机译:照射缺陷检查方法,检查装置的照射不良以及图像形成装置

摘要

PROBLEM TO BE SOLVED: To shorten an inspection time for an irradiation failure.;SOLUTION: An irradiation failure inspecting method includes: acquiring read data when a scanner reads an irradiation surface of an irradiation unit in a state where a reading surface of the scanner faces the irradiation surface of the irradiation unit and the irradiation unit irradiates photo-curable ink with light ; acquiring a value corresponding to an irradiation energy of the light from the irradiation unit by integrating the read data in a paper conveying direction of a printer; and determining that the irradiation failure occurs in the irradiation unit when the value corresponding to the irradiation energy of the light is equal to or less than a threshold value.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:缩短辐照故障的检查时间。解决方案:辐照故障的检查方法包括:在扫描仪的读取面朝向表面的状态下,当扫描仪读取照射单元的照射面时,获取读取数据。照射单元和照射单元的照射面向光固化性油墨照射光。通过将读取的数据在打印机的纸张传送方向上进行积分来获取与来自照射单元的光的照射能量相对应的值;当光的照射能量所对应的值等于或小于阈值时,确定在照射单元中发生照射失败。COPYRIGHT:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP5754162B2

    专利类型

  • 公开/公告日2015-07-29

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP20110036039

  • 发明设计人 中島 幹人;

    申请日2011-02-22

  • 分类号B41J2/01;B41J2/21;

  • 国家 JP

  • 入库时间 2022-08-21 15:30:39

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