Estimation method of junction temperature of the semiconductor device, estimating system and estimation program

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor element junction temperature estimation method, estimation system and estimation program which help to find the junction temperature of a semiconductor element with high accuracy.;SOLUTION: A junction temperature estimation system 2 comprises: an arithmetic processing device 10; an input device 20; a storage device 30; and an output device 40. The storage device 30 stores energization condition and other information 32, voltage temperature characteristic information 34, and an arithmetic operation program 36. The arithmetic operation program 36 is a program stipulating an arithmetic process in which the junction temperature of a semiconductor element under a prescribed energization condition corresponding to an elapse of time after energization has started under the energization condition is calculated a prescribed number of times. When the arithmetic operation program 36 is executed, calculations are performed in steps, including the acquisition or calculation of T_jn, the acquisition of a forward voltage V_Fn at T_jn, the acquisition of a I₁ value, the calculation of P_n, and the calculation of ΔT_jn.;COPYRIGHT: (C)2013,JPO&INPIT