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Resistance value calculation program, resistance value calculation method, resistance value calculation device

机译:电阻值计算程序,电阻值计算方法,电阻值计算装置

摘要

A resistance value calculating method of a computer calculating a resistance value of a wiring of a semiconductor circuit device, the method includes dividing the wiring into rectangular regions where each of the regions has an orthogonal coordinate system and are mutually not contained, drawing a first line segment up to a front of an edge portion of an overlapped region in which a first divided region and a second divided region overlap in a longitudinal direction of a center portion of the first region, drawing a second line segment in a longitudinal direction of a center portion of the second region after the first line segment is drawn, and calculating a resistance value of the first region and the second region in accordance with a length of each line segment and a width of each region.
机译:计算机的电阻值计算方法,其计算半导体电路装置的布线的电阻值,该方法包括将布线划分为矩形区域,其中每个区域具有正交坐标系并且彼此不包含,绘制第一条线沿重叠区域的边缘部分的前部进行分割,其中第一分割区域和第二分割区域在第一区域的中央部分的纵向上重叠,并且在中心的纵向上绘制第二线段绘制出第一线段之后的第二区域的第二部分,并根据各线段的长度和各区域的宽度计算第一区域和第二区域的电阻值。

著录项

  • 公开/公告号JP5621427B2

    专利类型

  • 公开/公告日2014-11-12

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20100202193

  • 发明设计人 芳野 弘宣;

    申请日2010-09-09

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 15:29:07

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