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Method and arrangement for the in-situ process monitoring and control for the plasma processing tool

机译:用于等离子体处理工具的原位过程监视和控制的方法和装置

摘要

Configuration for implementing an automatic in-situ process control system during execution of the [SOLUTION] recipe is provided. Includes a control loop sensor configured at least to collect a set of sensor data to the first in order to facilitate the monitoring of the set point in the execution of the recipe, the control loop these sensors, the configuration, the process control loop I'm a part of. The configuration also includes a set of independent sensors does not make it is configured at least to collect a set of sensor data, a second part of the process control loop. Further still, the configuration includes a hub that is configured to at least receive the at least one set of sensor data and the second set of sensor data to the first. In addition, the configuration includes an analysis computer is coupled to communicatively formula hub and configured to perform the analysis of at least one of the sets of sensor data and the second set of sensor data to the first still . [Selection Figure Figure 2
机译:提供了用于在执行[SOLUTION]配方期间实施自动原位过程控制系统的配置。包括一个控制回路传感器,该回路至少配置为收集第一组传感器数据,以便于在配方执行过程中监控设定点,这些传感器的控制回路,配置,过程控制回路I'我的一部分。该配置还包括一组独立的传感器,没有使其至少配置为收集一组传感器数据,过程控制回路的第二部分。更进一步,该配置包括集线器,该集线器被配置为至少将至少一组传感器数据和第二组传感器数据接收到第一组。另外,该配置包括分析计算机,该分析计算机与通信公式集线器耦接并且被配置为对第一静止图像执行对传感器数据集和第二传感器数据集中的至少一个的分析。 [选择图图2

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