stacking direction determination method of multilayer electronic component, the stacking direction determination apparatus of the multilayer electronic component, multilayer electronic component series method of manufacture, and apparatus for manufacturing a multilayer electronic component series

摘要

stacked accurately and judges multilayer electronic lamination direction of the conductor layer of electronic components stacking direction determining method of the component, the lamination direction determination apparatus, a method of manufacturing multilayer electronic component series for aligning the stacking direction of the conductor layers of multilayer electronic component in a certain direction, and to provide an apparatus for manufacturing a multilayer electronic component series. Stacking direction determination apparatus of multilayer electronic component (3), and measuring means (11, 12), it has been provided with a judgment means (13), a. Measuring means (11, 12) acquires a measurement value related to infrared energy in which the conductor layer and the non-conductive layer is detected by the observation plane for observing the multilayer electronic component that is laminated (200). Determining means (13) sets a threshold value according to the measurement conditions, compared to this threshold and the measured value, determines the lamination direction of the conductor layers of multilayer electronic component (200) based on the comparison result.