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Device for Measuring Oxidation-Reduction Potential and Method for Measuring Oxidation-Reduction Potential

机译：氧化还原电位的测定装置及氧化还原电位的测定方法

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摘要

Provided is a small-sized device for measuring an oxidation-reduction potential, whereby an oxidation-reduction current and an oxidation-reduction potential can be measured by reducing noise even when a signal from a solution being measured is small. A device for measuring an oxidation-reduction potential is provided with a substrate (10), a working electrode (15) mounted on a surface of the substrate (10), and a bipolar transistor (21) for amplifying the output of the working electrode (15) also provided on the surface of the substrate (10), and the signal amplified by the bipolar transistor (21) is inputted to a processing circuit (18).

机译：本发明提供一种用于测定氧化还原电位的小型装置，即使在被测定溶液的信号小的情况下，也可以通过降低噪声来测定氧化还原电流和氧化还原电位。用于测量氧化还原电位的装置设置有基板（ 10 ），安装在基板（ 10）的表面上的工作电极（ 15 ）。）和用于放大工作电极（ 15 ）输出的双极晶体管（ 21 ）也设置在基板表面（ 10 ），将由双极型晶体管（ 21 ）放大的信号输入到处理电路（ 18 ）。 展开▼

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公开/公告号US2015226701A1

专利类型

公开/公告日2015-08-13

原文格式PDF

申请/专利权人 NATIONAL UNIVERSITY CORPORATION TOYOHASHI UNIVERS- ITY OF TECHNOLOGY;
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申请/专利号US201314419453

发明设计人 MASATO FUTAGAWA;KAZUAKI SAWADA;SOU TAKAHASHI;
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申请日2013-08-09

分类号G01N27/416;H01L29/40;H01L29/73;

国家 US

入库时间 2022-08-21 15:27:29

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