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Forming fence conductors using spacer etched trenches

机译:使用间隔物蚀刻沟槽形成栅栏导体

摘要

A spacer etching process produces ultra-narrow conductive lines in a plurality of semiconductor dice. Trenches are formed in a first dielectric then a sacrificial film is deposited onto the first dielectric and the trench surfaces formed therein. Planar sacrificial film is removed from the face of the first dielectric and bottom of the trenches, leaving only sacrificial films on the trench walls. A gap between the sacrificial films on the trench walls is filled in with a second dielectric. A portion of the second dielectric is removed to expose tops of the sacrificial films. The sacrificial films are removed leaving ultra-thin gaps that are filled in with a conductive material. The tops of the conductive material in the gaps are exposed to create “fence conductors.” Portions of the fence conductors and surrounding insulating materials are removed at appropriate locations to produce desired conductor patterns comprising isolated fence conductors.
机译:间隔物蚀刻工艺在多个半导体管芯中产生超窄导线。在第一电介质中形成沟槽,然后将牺牲膜沉积到第一电介质上并在其中形成沟槽表面。从第一电介质的表面和沟槽的底部去除平面的牺牲膜,仅在沟槽壁上留下牺牲膜。沟槽壁上的牺牲膜之间的间隙被第二电介质填充。去除第二电介质的一部分以暴露牺牲膜的顶部。去除牺牲膜,留下超薄间隙,该间隙填充有导电材料。间隙中的导电材料顶部暴露在外,以形成“栅栏导体”。在适当的位置去除栅栏导体的一部分和周围的绝缘材料,以产生包括隔离的栅栏导体的期望的导体图案。

著录项

  • 公开/公告号US9034758B2

    专利类型

  • 公开/公告日2015-05-19

    原文格式PDF

  • 申请/专利权人 MICROCHIP TECHNOLOGY INCORPORATED;

    申请/专利号US201313836647

  • 发明设计人 PAUL FEST;

    申请日2013-03-15

  • 分类号H01L21/44;H01L23/528;H01L21/768;

  • 国家 US

  • 入库时间 2022-08-21 15:20:47

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