首页> 外国专利> Microelectronic assembly comprising dielectric structures with different young modulus and having reduced mechanical stresses between the device terminals and external contacts

Microelectronic assembly comprising dielectric structures with different young modulus and having reduced mechanical stresses between the device terminals and external contacts

机译:微电子组件,包括介电结构,该介电结构具有不同的杨氏模量,并且器件端子和外部触点之间的机械应力降低

摘要

A microelectronic assembly may include a substrate containing a dielectric element having first and second opposed surfaces. The dielectric element may include a first dielectric layer adjacent the first surface, and a second dielectric layer disposed between the first dielectric layer and the second surface. A Young's modulus of the first dielectric layer may be at least 50% greater than the Young's modulus of the second dielectric layer, which is less than two gigapascal (GPa). A conductive structure may extend through the first and second dielectric layers and electrically connect substrate contacts at the first surface with terminals at the second surface. The substrate contacts may be joined with contacts of a microelectronic element through conductive masses, and a rigid underfill may be between the microelectronic element and the first surface. The terminals may be usable to bond the microelectronic assembly to contacts of a component external to the microelectronic assembly.
机译:微电子组件可以包括包含具有第一和第二相对表面的介电元件的衬底。介电元件可以包括与第一表面相邻的第一介电层,以及设置在第一介电层和第二表面之间的第二介电层。第一介电层的杨氏模量可以比第二介电层的杨氏模量大至少50%,第二杨氏模量小于两个吉帕斯卡(GPa)。导电结构可以延伸穿过第一和第二介电层,并将第一表面处的基板触点与第二表面处的端子电连接。衬底触点可以通过导电块与微电子元件的触点接合,并且刚性底部填充可以在微电子元件和第一表面之间。端子可用于将微电子组件结合到微电子组件外部的部件的触点。

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