首页> 外国专利> Method for producing p-type ZnO based compound semiconductor layer, method for producing ZnO based compound semiconductor element, and an n-type ZnO based compound semiconductor laminate structure

Method for producing p-type ZnO based compound semiconductor layer, method for producing ZnO based compound semiconductor element, and an n-type ZnO based compound semiconductor laminate structure

机译:生产p型ZnO基化合物半导体层的方法,生产ZnO基化合物半导体元件的方法和n型ZnO基化合物半导体叠层结构

摘要

A method for producing a p-type ZnO based compound semiconductor layer including the steps of (a) supplying (i) Zn, (ii) O, (iii) optional Mg, and (iv) a Group 11 element which is Cu and/or Ag to form a MgxZn1-xO (0≦x≦0.6) single crystal film doped with the Group 11 element; (b) supplying at least one Group 13 element selected from the group consisting of B, Ga, Al, and In on the MgxZn1-xO (0≦x≦0.6) single crystal film; (c) alternately carrying out the steps (a) and (b) to form a laminate structure; and (d) annealing the laminate structure to form a p-type MgxZn1-xO (0≦x≦0.6) layer co-doped with the Group 11 element and the Group 13 element.
机译:一种用于制造p型ZnO基化合物半导体层的方法,该方法包括以下步骤:(a)提供(i)Zn,(ii)O,(iii)可选Mg和(iv)Cu和// 11族元素或Ag形成掺杂有第11族元素​​的Mg x Zn 1-x O(0≤x≤0.6)单晶膜;或(b)在Mg x Zn 1-x O上提供至少一种选自B,Ga,Al和In的13族元素(0≤ x≤0.6)单晶膜; (c)交替进行步骤(a)和(b)以形成层压结构; (d)对叠层结构进行退火,以形成共掺杂有第11组的p型Mg x Zn 1-x O(0≤x≤0.6)层元素和第13组元素。

著录项

  • 公开/公告号US9064791B2

    专利类型

  • 公开/公告日2015-06-23

    原文格式PDF

  • 申请/专利权人 STANLEY ELECTRIC CO. LTD.;

    申请/专利号US201414197900

  • 发明设计人 CHIZU SAITO;HIROYUKI KATO;MICHIHIRO SANO;

    申请日2014-03-05

  • 分类号H01L21;H01L21/16;H01L29/22;H01L21/02;H01L29/12;

  • 国家 US

  • 入库时间 2022-08-21 15:19:47

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