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Manipulation of traces for debugging behaviors of a circuit design

机译:处理迹线以调试电路设计的行为

摘要

A viewer shows circuit design activities, displaying a signal, its corresponding trace, and the values of the trace over time. A global zoom-in, zoom-out, and zoom-fit are provided over the value display to adjust the time interval covered within the viewer. Non-linear manipulation of the traces within the viewer enables simultaneous zoomed in display of multiple time intervals, and zoomed out display of other time intervals. The non-linear manipulations may be performed within a same display region by designating zoom groups corresponding to the selection of a designated time period of activities of the circuit. Each zoom group may be scaled independently of other timer periods to zoom in or out of activities occurring within the designated time period. A list of behaviors may also be provided. Selection of a behavior generates a separate signal list for signals associated with the behavior and corresponding traces for enhanced debugging.
机译:查看器显示电路设计活动,显示信号,其相应的迹线以及随时间变化的迹线值。在值显示上提供全局放大,缩小和缩放适合,以调整查看器内的时间间隔。在查看器内对迹线进行非线性处理,可以同时放大多个时间间隔的显示,并缩小其他时间间隔的显示。可以通过指定对应于电路活动的指定时间段的选择的缩放组来在同一显示区域内执行非线性操纵。每个缩放组可以独立于其他计时器周期缩放,以放大或缩小在指定时间段内发生的活动。也可以提供行为列表。行为的选择会为与行为相关的信号生成单独的信号列表,并为增强调试生成相应的迹线。

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