Visualizing sensitivity information in integrated circuit design

摘要

A method, system, and computer program product for visualizing sensitivity information in integrated circuit (IC) design are provided in the illustrative embodiments. A plurality of sensitivity information corresponding to a first component in the IC design is received, wherein the plurality of sensitivity information includes a first sensitivity information indicating a first variation in a first electrical characteristic of a group of components as a result of a variation in an electrical characteristic of the first component. A plurality of aspects of the first sensitivity information are rendered in visual form to form a first visualization. The first visualization is presented on a schematic view of the IC design in an IC design tool such that the first sensitivity information is visually associated with the first component in the IC design.