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Scanned probe microscopy (SPM) probe having angled tip
Scanned probe microscopy (SPM) probe having angled tip
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机译:具有倾斜尖端的扫描探针显微镜(SPM)探针
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摘要
A probe for scanned probe microscopy is provided. The probe includes a cantilever beam and a tip. The cantilever beam extends along a generally horizontal axis. The cantilever beam has a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis. The tip projects outwardly from the crystal facet surface.
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