Array probe and eddy current compensation process for lifting during operation without lifting known references

摘要

A CE system (eddy current) for detecting defects in a test object, the system comprising: (a) a probe matrix EC configured with a sensor arrangement, which includes: (i) a plurality of first sensors EC type which are orthogonal sensors (128) arranged in channels and configured to induce eddy currents in the test object and for detecting and outputting a first signal representative of defects in the test object; characterized in that (ii) a plurality of second sensors and ec which are absolute sensors (129) configured to produce from the test object (50) with second signals indicative of a lifting distance of said orthogonal and absolute EC sensors (128 , 129) relative to said test object, said coil arrangement being configured EC that a predetermined relationship between said second signals and said first signals, at different distances is established elevation; (B) a configuration table comprising calibration values ​​of said orthogonal EC sensors (128) with compensation values ​​corresponding to said lift channels based on said second signals; and (c) an acquisition unit responsive to said compensation values ​​calibration and elevation in said configuration table and said second signals and configured to convert said first signals obtained from said EC sensors orthogonal (128) during testing real of said test object, to obtain third signals that are representative of said defects in said test object, with said third substantially independent signals distances prevailing actual elevation between said EC sensors and said test object (50) at the time of obtaining said first signals by said actual tests.