首页> 外国专利> An eddy current array probe and method for lift-off compensation during operation without known lift references

An eddy current array probe and method for lift-off compensation during operation without known lift references

机译:没有已知升程参考值的涡流阵列探头和用于在运行期间进行升程补偿的方法

摘要

The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.
机译:本发明提供了一种用于补偿由涡流阵列探头的提离变化引起的灵敏度变化的方法。本发明以两种分开的方式使用涡流阵列探针线圈,以产生第一组检测通道和第二组剥离测量通道,而无需添加专用于剥离测量操作的线圈。本发明的另一方面提供了一种改进的校准过程,其在包括参考缺陷的简单校准块上结合了检测和剥离测量通道的校准,而无需预定的剥离条件。

著录项

  • 公开/公告号EP2642281A1

    专利类型

  • 公开/公告日2013-09-25

    原文格式PDF

  • 申请/专利权人 OLYMPUS NDT INC.;

    申请/专利号EP20130000076

  • 发明设计人 LEPAGE BENOIT;

    申请日2013-01-09

  • 分类号G01N27/90;

  • 国家 EP

  • 入库时间 2022-08-21 16:28:51

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