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Process for the preparation of a dielectric barrier layer of silicon oxide (SiOx) layer and thus prepared

机译:制备氧化硅(SiOx)层的介电阻挡层的方法并由此制备

摘要

Process for the preparation of a dielectric barrier layer of silicon oxide (SiOx) on a substrate, for which is performed, after cleaning the substrate, deposition of a layer of SiOx by the technique of PECVD and other deposition SiOx by the sol-gel method. The coating composition (sol) used in step sol-gel is prepared from the following components: MTES, 30 to 50% by weight; TEOS, between 7% and 12% by weight; N, N'-DMS, between 11 and 19% by weight; PEG, between 19 and 31% by weight; distilled water between 7 and 12 wt% orthophosphoric acid, from 0.6% to 0.9% by weight. Once prepared the coating composition, it is deposited and densified to form the corresponding oxide layer.
机译:在衬底上制备氧化硅(SiOx)的介电阻挡层的方法,为此,在清洁衬底之后,通过PECVD技术沉积SiOx层,并通过溶胶-凝胶法沉积其他SiOx 。由下列组分制备用于步骤溶胶-凝胶的涂料组合物(溶胶):MTES,30至50重量%;和TEOS,按重量计介于7%和12%之间; N,N'-DMS,按重量计为11%至19%; PEG,按重量计介于19%至31%之间;在7至12 wt%的正磷酸之间的蒸馏水,重量百分比为0.6%至0.9%。一旦制备了涂料组合物,就将其沉积并致密以形成相应的氧化物层。

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