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Process for the preparation of a silicon oxide (SiOx) dielectric barrier layer and layer thus prepared

机译:制备氧化硅(SiOx)介电阻挡层的方法和由此制备的层

摘要

The invention relates to a method for preparing a dielectric barrier layer of silicon oxide (SiOx) on a substrate. Once the substrate is cleaned, the method involves depositing a layer of SiOx using the PECVD technique and depositing another layer of SiOx using the sol-gel method. The coating composition (sol) used in the sol-gel stage is prepared using the following components: between 30 and 50 wt.% MTES; between 7 and 12 wt.% TEOS; between 11 and 19 wt.% N,N-DMS; between 19 and 31 wt.% PEG; between 7 and 12 wt.% distilled water; and between 0.6 and 0.9 wt.% orthophosphoric acid. Once prepared, the coating composition is deposited and densified to form the corresponding oxide layer.
机译:本发明涉及在衬底上制备氧化硅(SiOx)的介电阻挡层的方法。清洁基材后,该方法包括使用PECVD技术沉积SiOx层和使用溶胶-凝胶法沉积另一层SiOx。使用以下组分制备用于溶胶-凝胶阶段的涂料组合物(溶胶):30-50重量%的MTES;和7至12重量%的TEOS; N,N-DMS为11至19重量%; 19至31重量%的PEG; 7至12重量%的蒸馏水;和0.6至0.9重量%的正磷酸。一旦制备,就沉积涂料组合物并使其致密以形成相应的氧化物层。

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