Procedure for measuring the 3db bandwidth in tunnel amplifiers or narrow band amplifiers through temperature measurements in small signal (Machine-translation by Google Translate, not legally binding)

摘要

Procedure for the measurement of the bandwidth to 3db in tuned amplifiers or narrow band by means of temperature measurements in small signal. The present invention relates to a method for measuring the bandwidth to 3db of tuned or narrow-band amplifiers by means of small-signal temperature measurements. Fig. 1 shows an integrated circuit (1) containing a tuned amplifier (2). The figure also shows the generator that supplies a direct voltage to feed the amplifier (3) and the signal generator (4) that provides the amplifier with two sinusoidal functions whose frequencies differ in δ f hertz. Measurements of the amplitude of the spectral component of the temperature at the frequency δ f at selected points of the integrated circuit, in this case point (6), allow the measurement of the bandwidth to 3db of the amplifier without the need to use measuring equipment of analog signals at high frequency. (Machine-translation by Google Translate, not legally binding)