Procedure for the measurement of the center frequency and the bandwidth 3db in tuned or narrow-band amplifiers by means of continuous temperature measurements (Machine-translation by Google Translate, not legally binding)

摘要

Procedure for the measurement of the center frequency and the bandwidth to 3db in tuned or narrow band amplifiers by means of continuous temperature measurements. The present invention relates to a method for measuring the center frequency and the bandwidth at 3db of tuned or narrow-band amplifiers by means of continuous temperature measurements. Fig. 1 shows an integrated circuit (1) containing a tuned amplifier (2). The figure also shows the generator that supplies a direct voltage to feed the amplifier (3) and the signal generator (4) that provides the amplifier with a sinusoidal function. Measurements of the amplitude of the continuous component of the temperature at selected points of the integrated circuit, in this case point (6), allow the measurement of the center frequency of the amplifier, and its bandwidth to 3db, through the use of simple measuring instruments for continuous voltages. (Machine-translation by Google Translate, not legally binding)