LASER SCANNING MICROSCOPE AND METHOD FOR CORRECTING IMAGING ABERRATIONS MORE PARTICULARLY IN HIGH-RESOLUTION SCANNING MICROSCOPY

摘要

The invention relates to a laser scanning microscope (SR-LSM) (1) and a method for correcting imaging aberrations in a laser scanning microscope. The SR-LSM comprises an illumination device (3) for providing an illumination spot (11); a scanner (7) for moving the illumination spot (11) over a sample (P) to be examined at successive scanning positions; preferably an adaptive optical unit for influencing a wavefront of the illumination spot (11) with a control device and a detector (16) for detecting a spatially resolved imaging spot (14) emitted by the sample. According to the invention, provision is made of an evaluation unit (21) for determining a point spread function (PSF) of the imaging spot (14) in each scanning position, wherein a wavefront correction signal ascertained from the point spread function (PSF) of a scanning position is fed to the control device (26) of the adaptive optical unit or is used in digital post-processing of the microscope image (e.g. by means of deconvolution).