首页> 外国专利> LASER SCANNING MICROSCOPE AND METHOD FOR CORRECTING IMAGING ABERRATIONS MORE PARTICULARLY IN HIGH-RESOLUTION SCANNING MICROSCOPY

LASER SCANNING MICROSCOPE AND METHOD FOR CORRECTING IMAGING ABERRATIONS MORE PARTICULARLY IN HIGH-RESOLUTION SCANNING MICROSCOPY

机译:激光扫描显微镜及其在高分辨扫描显微镜中更正像差的方法

摘要

A laser scanning microscope (SR-LSM) and a method for correcting imaging errors in a laser scanning microscope. The SR-LSM includes an illumination device for providing an illumination spot; a scanner for moving the illumination spot to consecutive scanning positions over a sample to be examined; an adaptive optics unit for controlling a wavefront of the illumination spot with a control device and a detector for determining a spatially resolved imaging spot emitted by the sample. An evaluation unit is provided for determining a point-spread function (PSF) of the imaging spot at each scanning position, whereby a wavefront correction signal determined from the point-spread function (PSF) of a scanning position is supplied to the control device of the adaptive optics unit or is used in digital post-processing of the microscope image (e.g. by means of deconvolution).
机译:激光扫描显微镜(SR-LSM)和用于校正激光扫描显微镜中的成像误差的方法。 SR-LSM包括用于提供照明点的照明装置。用于将照明光斑移动到要检查的样品上的连续扫描位置的扫描仪;自适应光学单元,用于通过控制装置和检测器来控制照明光斑的波前,该检测器用于确定样本发射的空间分辨成像光斑。提供评估单元,用于确定每个扫描位置处的成像点的点扩展函数(PSF),由此将从扫描位置的点扩展函数(PSF)确定的波前校正信号提供给控制单元自适应光学单元或用于显微镜图像的数字后处理(例如,通过反卷积)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号