CONFIGURABLE BUILT-IN SELF-TESTS OF DIGITAL LOGIC CIRCUITS

摘要

An electronic device (300) comprising a digital logic circuit (101) and a test module (302) for testing the digital logic circuit is provided. The test module is adapted to generate test patterns based on a key and test parameters, apply the test patterns to the digital logic circuit, receive test responses from the digital logic circuit, compact the test responses into a test signature, and determine a test result (115) by comparing the test signature with an expected signature. The electronic device further comprises a writable storage means (311) for storing the key and the expected signature, and an interface (312) for writing the key and the expected signature to the writable storage means. Since the key and the expected signature are configurable after manufacturing, the provision of hardware Trojans during manufacturing is hampered, for the reason that an adversary does not have complete knowledge of the test patterns which will be generated during the lifetime of the electronic device.