首页> 外国专利> PROBABILISTIC FATIGUE LIFE PREDICTION USING ULTRASONIC INSPECTION DATA CONSIDERING EIFS UNCERTAINTY

PROBABILISTIC FATIGUE LIFE PREDICTION USING ULTRASONIC INSPECTION DATA CONSIDERING EIFS UNCERTAINTY

机译:使用考虑EIFS不确定性的超声检查数据进行概率疲劳寿命预测

摘要

A method for probabilistically predicting fatigue life in materials includes sampling a random variable for an actual equivalent initial flaw size (EIFS), generating random variables for parameters (ln C, m) of a fatigue crack growth equation  a  N = C  ( Delta   K ) m from a multivariate distribution, and solving the fatigue crack growth equation using these random variables. The reported EIFS data is obtained by ultrasonically scanning a target object, recording echo signals from the target object, and converting echo signal amplitudes to equivalent reflector sizes using previously recorded values from a scanned calibration block. The equivalent reflector sizes comprise the reported EIFS data.
机译:一种概率性预测材料疲劳寿命的方法,包括对实际等效初始缺陷尺寸(EIFS)的随机变量进行采样,为疲劳裂纹扩展方程a = N = C generating生成参数(ln C,m)的随机变量。从多元分布中求出,然后用这些随机变量求解疲劳裂纹扩展方程。通过超声扫描目标对象,记录来自目标对象的回波信号,以及使用先前记录的来自扫描校准块的值将回波信号幅度转换为等效的反射器大小,可以获得报告的EIFS数据。等效的反射器尺寸包括报告的EIFS数据。

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