首页> 外国专利> METHOD AND APPARATUS THEREOF FOR VERIFYING BAD PATTERNS IN SENSOR-MEASURED TIME SERIES DATA

METHOD AND APPARATUS THEREOF FOR VERIFYING BAD PATTERNS IN SENSOR-MEASURED TIME SERIES DATA

机译:验证传感器测量的时间序列数据中不良模式的方法和装置

摘要

Sensor measurements in the form of a series of bad pattern sensing data can be examined a device and method and be provided. According to the present invention, including a step, that one bad pattern information of receiving is applied to sensing data series in the form of the charge of sensor to rear progression form to the bad pattern proof method of sensing data afterwards for a period of time for a period of time, the time series of respective product, it is generated by the charge of the sensor for validation period form the following steps are included: there is the sensing data for accessing similarity between the bad pattern information bad pattern of the time series form in the data of sensing according to the step calculated for each product, based on association, its error rate for being used to calculate bad pattern step includes.
机译:一系列不良模式感测数据形式的传感器测量结果可以通过一种设备和方法进行检查并提供。根据本发明,包括以下步骤:将接收到的不良模式信息以传感器的费用向后方进行的形式施加到感测数据序列上,之后进行一段时间的感测数据的不良模式验证方法。在一段时间内,各个产品的时间序列,是由传感器的电荷在有效期内生成的,包括以下步骤:存在用于访问时间差模式信息差模式之间相似性的感测数据根据为每个产品计算的步长在感测数据中的序列形式,基于关联,其错误率用于计算不良图案步长。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号