首页>
外国专利>
Method and apparatus thereof for verifying bad patterns in sensor-measured time series data
Method and apparatus thereof for verifying bad patterns in sensor-measured time series data
展开▼
机译:用于验证传感器测量的时间序列数据中的不良模式的方法及其装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
sensor measurements in the form of a series of bad pattern sensing data can be verified An apparatus and method are provided. Bad pattern verification method of sensing data in a time series form in accordance with the present invention includes a step that receives a bad pattern information to be applied to the sensing data in a time series in the form of charges of the sensor, the time series of the respective products generated by the charges of the sensor for validation Period form comprising the steps of accessing the sensing data of the degree of similarity between the bad pattern information bad pattern with the time-series form in the sensed data in accordance with a step of computing for each product, based on the correlations for calculating the error rate of the bad pattern Steps include. ;
展开▼