首页> 外国专利> PARTS OF SEMICONDUCTOR AND DISPLAY EQUIPMENTS WITH IMPROVED ANTI-PLASMA CORROSION AND METHOD IMPROVING ANTI-PLASMA CORROSION OF PARTS

PARTS OF SEMICONDUCTOR AND DISPLAY EQUIPMENTS WITH IMPROVED ANTI-PLASMA CORROSION AND METHOD IMPROVING ANTI-PLASMA CORROSION OF PARTS

机译:具有改善的抗等离子腐蚀性能的半导体和显示设备零件以及改善零件的抗等离子腐蚀性能的方法

摘要

To solve a problem that the process component of semiconductor or display manufacturing equipment is etched by the exposure of plasma, the present invention relates to a method of processing anti-plasma corrosion of a process component by removing peaks and valleys of the surface of ceramic powder (the surface of a coating layer and the surface of the process component) before and after powder coating is performed on the process component, and the process component with improved anti-plasma corrosion. Provided is a process component of semiconductor or display manufacturing equipment exposed by plasma. A coating layer is formed on the surface of a main body where valleys and peaks are partly or totally removed. Provided is a process component with improved anti-plasma corrosion where valleys and peaks are partly or totally removed on the surface of a coating layer.
机译:为了解决通过暴露等离子体而腐蚀半导体或显示器制造设备的处理部件的问题,本发明涉及通过去除陶瓷粉末表面的峰和谷来处理处理部件的抗等离子腐蚀的方法。在处理部件上进行粉末涂布之前和之后(涂层的表面和处理部件的表面)(涂层表面和处理部件的表面),并且具有改善的抗等离子体腐蚀的处理部件。提供了通过等离子体暴露的半导体或显示器制造设备的处理组件。在主体的表面上形成涂层,在该表面上部分或全部去除了谷和峰。提供了具有改善的抗等离子体腐蚀的工艺部件,其中在涂层表面上部分或全部去除了谷和峰。

著录项

  • 公开/公告号KR20150068285A

    专利类型

  • 公开/公告日2015-06-19

    原文格式PDF

  • 申请/专利权人 FEMVIX;KIM OK RYUL;KIM OK MIN;

    申请/专利号KR20140154200

  • 发明设计人 KIM OK MIN;KIM OK RYUL;

    申请日2014-11-07

  • 分类号H01L21/3065;H01L21/56;

  • 国家 KR

  • 入库时间 2022-08-21 14:59:51

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号