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A method for de-bonding of device wafer and carrier wafer and apparatus for de-bonding

机译:器件晶片和载体晶片的解键合方法以及解键合装置

摘要

The present invention relates to a method and apparatus for de-bonding of the device wafer and the carrier wafer , as a device wafer and a method for de-bonding the light-heat conversion layer and the UV coating layer is bonded to the bonded wafer between the carrier wafer, a) a light-transmitting side of the wafer carrier is to examine the dose-controlled laser bumps on the device wafer of the lower and preventing the chip from being damaged, and decomposing the photo-thermal conversion layer; 2) light-heat step of separating the wafer from the carrier one end of the device wafer in a state conversion layer is a top exploded carrier wafer to position the de-bonding means to the vacuum contact; 3) comprising a carrier wafer coated with a separation layer on a UV protection layer at the time of the UV layer and open; And 4) and then be cured with UV sticking layer a protective layer separating the protective layer using the release tape; includes ;
机译:技术领域本发明涉及一种用于将器件晶片和载体晶片剥离的方法和设备,因为器件晶片以及用于将光热转换层和UV涂层粘合到接合的晶片的方法在载体晶片之间,a)晶片载体的透光侧是检查下部的器件晶片上的剂量控制的激光凸块,防止芯片损坏,并分解光热转换层; 2)在状态转换层中将晶片与器件晶片的载体的一端分离的光热步骤是顶部分解的载体晶片,以将分离装置定位到真空接触; 3)包括在UV层打开时在UV保护层上涂覆有分离层的载体晶片;以及4)然后用紫外线粘合层固化保护层,使用剥离带将保护层分开;包括;

著录项

  • 公开/公告号KR101503326B1

    专利类型

  • 公开/公告日2015-03-18

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20130101552

  • 发明设计人 허성무;김용섭;배준호;한재현;

    申请日2013-08-27

  • 分类号H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 14:58:29

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