首页> 外国专利> Wear leveling method of Non-volatile memory device having single level memory cell block and multi level memory cell block

Wear leveling method of Non-volatile memory device having single level memory cell block and multi level memory cell block

机译:具有单级存储单元块和多级存储单元块的非易失性存储装置的损耗均衡方法

摘要

a This invention is a single-level memory cell block and a multi-level nonvolatile memory device comprising a memory cell block method is disclosed for the wear leveling. Wear-leveling method, comprising the steps of obtaining the all memory cell blocks, each of the erase counts of the non-volatile memory device calculates the average erase count, calculating a program / erase count of a single-level memory cell block, in terms of the multi-level memory cell block The program / calculating the number of times of erasing, and programming of single level memory cell block / erase count and the multi-level memory cells in terms of the program of the block / the sum of the erase counts edaga If the value obtained by subtracting the average erase count is set threshold value or more wear and performing a leveling operation. ; wear-leveling method, single-level memory cell block, a multi-level memory cell block, the program / erase count threshold
机译:本发明是一种单级存储单元块,并公开了一种用于损耗均衡的包括存储单元块方法的多级非易失性存储器件。损耗均衡方法,包括以下步骤:获得所有存储单元块,非易失性存储器件的每个擦除计数计算平均擦除计数,计算单级存储单元块的编程/擦除计数。多级存储单元块的编程/擦除次数的计算,以及单级存储单元块的编程/擦除计数和多级存储单元的块编程/总和擦除次数edaga如果通过减去平均擦除次数获得的值被设置为阈值或更大磨损并执行调平操作。 ;耗损均衡方法,单级存储单元块,多级存储单元块,编程/擦除计数阈值

著录项

  • 公开/公告号KR101548175B1

    专利类型

  • 公开/公告日2015-08-28

    原文格式PDF

  • 申请/专利权人 삼성전자주식회사;

    申请/专利号KR20080109467

  • 发明设计人 이양섭;

    申请日2008-11-05

  • 分类号G11C16/34;G11C16/10;G11C16/16;

  • 国家 KR

  • 入库时间 2022-08-21 14:57:44

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