Method study of the temperature-dependent resistance film samples when heated

摘要

Method of investigation of the temperature dependence of the electric resistance film samples when heated, comprising heating them to a predetermined temperature and measuring the electrical resistance in the heating process, characterized in that the sample placed in a quartz reactor, comprising a housing on the outside for heating the film sample and measuring its electrical resistance whose surface bifilar wound resistive heater, and the housing wall, in its central part, is installed a thermocouple to measure said temperature of the sample, the sample inside the casing is set in the C-shaped clamps with flat lips that are made of tungsten wire, wherein said C -shaped clamps raskreplyayut bracing wire that is in the form of springs of a smaller diameter tungsten wire, after which, by means of a resistive heater disposed on the housing surface produce heating of the sample to a predetermined temperature, wherein by C-clamps and stretch marks on the sample supplied measuring current and voltage is determined, and the sample temperature measurement is carried out by means of said thermocouples, and the required distance from the surface of the sample to the measurement of the thermocouple element and its centering with respect to the thermocouple is performed by means of said extensions.